AH 2550A는 커패시턴스 / 손실 브리지 (수동 또는 자동)에서 탁월한 안정성, 해상도 및 정확도를 제공합니다. 

수많은 최신 기능으로 인해 이전 제품인 AH2500A와 마찬가지로 사용자 친화적 인 기기입니다. 

AH2550A의 정밀성과 사용 편의성은 광범위한 분야에서 과학, 교정 및 생산 분야에서 새로운 응용 분야를 창출하고 있습니다.

• Patented, digital phase-shifting circuitry needs no calibration and is temperature independent.
• Enhanced test diagnostics are better able to isolate component failures and require less intervention by the operator.
• Line-related noise rejection has been made even better.
• Complete re-design of the digital circuitry provides very high reliability.
• Upper limit of test signal voltage has a minimum setting of 0.3 mV versus 0.5 mV previously.
• Largest measurable capacitance is now 1.5 µF versus 1.2 µF previously.
• A real-time clock has been added.
• The serial interface is compatible with the IEEE-1174 Standard.
• The front panel display is fully alphanumeric.
• The number of LED indicators on the front panel has been increased from 8 to 10.